• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    1. METHOD OF CORRECTING THE ERROR OF POSITIONING THE LIGHT RAY, which is that the light beam is deflected pointwise and line by line using a mirror polyhedron in plane-image that is moved relative to the mirror polyhedron and transverse to the direction of deflection, then the error is determined. depending on the magnitude of the correction, characterized in that, in order to improve the accuracy of the correction of positioning errors, in the flat scan set test points in . the direction of the true scan line, for each mirror surface of the polyhedron, the deviations of the position of points relative to the true line of skewing are measured in two coordinates, the values obtained are formed and the correction signals are remembered, the position of the beam is corrected by further changing the position of the beam by the correction value, then perform verification tests that reveal correction errors, and change the value of the previously obtained correction in accordance with the received rejected and the positions of the beam and repeat these operations until the error is fully compensated, after which the modified correction values for the individual mirror surfaces of the polyhedron are memorized and then read and used to correct positioning errors. 2. Sporb according to Clause 1, from lich ayi yu and the fact that coordinate-wise (L additional deviations of the light beam before pointwise and progressive Skas: nirovanie produced using a mirror polyhedron. 3. The method according to; PP.1 and 2, characterized in that for each mirror surface the polyhedron 4 interpolates and memorizes, from the obtained correction values, the function of the cortex response, which is read during the operation of CD 00 CD and is used for the current correction of positioning errors. 4. The method according to claims 1-3, characterized in that light deviation points relative to the reference point in two perpendicularly disposed to the direction of scan photosensitive surfaces is determined by measuring the two photocurrents which integriR5POT and integrated photocurrents of generating a residual signal as a coordinate value J.
    公开号:SU1145939A3
    申请号:SU813363417
    申请日:1981-12-07
    公开日:1985-03-15
    发明作者:Юргенсен Хайнрих；Зеленка Томас
    申请人:Др-Инж.Рудольф Хелль Гмбх (Фирма)；
    IPC主号:
    专利说明:

    5. A method according to claims, characterized in that the deviations of the position of the light point from the control points in the scanning direction are determined by measuring the time of movement of the light point between the control points, then form the signal of the difference in motion time as the value of the X coordinate. 6. Method POP1, characterized in that, in order to use a light beam modulated by a video signal, the position of the image information is corrected by changing the time sequence of the video signal values to the corresponding correction values. 7. The method according to claim 6, characterized in that the time sequence 11 9 of the video signal values is changed by means of a controllable correction of the change in the time delay, 8. The method according to claim 6, characterized in that the video signal values are memorized and read through the signal cycle , moreover, the time sequence of the video signal values is varied by means of a change in the read cycle frequency controlled by the correction values. 9. Method according to claims 6-8, characterized in that the reading of the video signal values is carried out at the beginning of the line by means of a synchronizing start pulse.
    . The invention relates to an electronic reproduction technique, in particular, to methods for correcting positioning errors of a light beam deflected by means of a deflecting system with at least one mirror surface point by point and line by line on a plane moving perpendicular to the direction of deflection, in which positioning errors are determined and then corrected with appropriate correction values.
    The closest technical solution to the present invention is a method for correcting the positioning errors of a multifaceted rotary mirror, implemented by a device in which a correction deflector is positioned on the beam path between the light source and the multifaceted rotary mirror, with each mirror surface being assigned only one correction value, so that they remain irremovable errors caused by the unevenness of the mirror surfaces G 1 The disadvantage of this method is that the accuracy to The correction is small.
    The purpose of the invention is to improve the accuracy of position error correction.
    This goal is achieved by the fact that the cornacijo method of correcting the positioning errors of the light, consists in the fact that the light beam is deflected pointwise and line by line with the help of a mirror polyhedron in the scanning plane, which is moved relative to the mirror polyhedron and transverse to the direction of deflection, after which the positioning error is determined and eliminate its b. depending on the magnitude of the correction; in the scanning plane, set control points in the direction of the true scan line, for each This mirror surface of the polyhedron measures the deviations of the position of the points relative to the true scanning line in two coordinates, form and memorize correction signals based on the obtained values, correct the position of the beam by further changing the position of the beam to the magnitude of the correction, then carry out verification tests for which errors of the correction core 31, and change the value of the previously obtained correction in accordance with the resulting deviations of the beam position and the repetition of the indicated operations until the absolute error compensation, after which the modified correction value for the individual mirror surfaces of the polyhedron is stored and is then read and used for correcting errors pyzitsioniro- ve.ni. Coordinate incremental deviations of the light beam before pointwise and line-by-line scanning are performed with the help of a mirror many facets. For each mirror surface, the polyhedron is interpolated and, from the obtained correction values, they recall the correction function, which is read during operation and is used for the current correction of positioning errors. The deviations of the position of the light point relative to the control point in two perpendicular to the scanning direction of the photosensitive surfaces are determined by measuring two photocurrents, which are integrated, and from the integrated photocurrents form a diffuse signal as the value of the Y coordinate. The deviations of the position of the luminous current from the control points in the napr, the scans of the scan are determined by measuring the time of movement of the spot between the control points, then form the difference signal apei of motion as the value of the X coordinate. The position of the image information is corrected by changing the time sequence of the video signal values to the corresponding correction value. The time sequence of the video signal order is changed by means of a controllable correction of a change in the delay time. The values of the video signal are memorized and calculated by means of a signal clock, the temporal sequence of values of the video signal being varied by means of a controllable correction of the change in the frequency of the read cycle. The comparison of the video signal values is carried out at the beginning of the line in step 94. synchronic start pulse. 1 shows a recording device with a correction system that implements the proposed method; 2 shows an example of a measuring device and a U-error measurement unit; FIG. 3 is a graphical Y-error measurement circuit of FIG. 4 — an example of execution of a X-error measuring unit, and FIG. 3 an example of a correction value sensor. 6 and 7 are embodiments of a device for implementing the method. The light source t, for example a laser, amplifies the light beam 2, the intensity of which is modulated by the recorded information in the modulator 3 of the light. The light modulator 3 may, for example, be an acoustic modulator. Recorded information is selected from a memory device, such as a digital storage device 4, and via line 5 is supplied to the modulator 3 of the light. The intensity modulated light beam 2 is deflected from the optical axis by the 6 X-correction element and the Y-correction element 7 located behind it to correct positioning errors. As the correction elements 6 and 7, controlled based on the correction values along lines 8 and 9, light deflectors, such as acousto-optic or other types of light deflectors, can be used. One common acousto-optic modulator can also be used to modulate the intensity and deflect the light beam. The corrected light beam 2 through the screen .10 with holes c, to prevent spurious light rays, and lenses 11 and 12, which serve to expand the light beam 2, falls on a rotating polyhedral rotating mirror 13, which has n mirror surfaces 14, the axis The rotation of which is directed perpendicularly to the optical axis of the light beam 2. In this example of the myogograny execution, the swivel mirror 13 has n 6 mirror surfaces. The motor 16 drives the multifaceted pivot mirror 13 in the direction indicated by the arrow 17 at a constant angular velocity. .51 On the plane substrate 18 there is an information carrier 19, for example, In the form of a film. By rotating the multifaceted pivot mirror 13, the light beam reflecting from the mirror surfaces 14 and focused by the lens 20 onto the information carrier 19 is constantly deflected in the X direction (row direction) along the information carrier 19. At the same time, the planar substrate 1 executes a periodic or continuous feed movement in the Y direction (feed direction). Thus, the deflected light beam 2 illuminates on the media 19 located next to row 21. In this case, with mirror surfaces 14, six lines 21 are recorded during mirror rotation, thus six rows 21. Outside the flat substrate 18 in the plane of deflection of the light beam 2 The optoelectronic pulse sensor 22 delivers a starting impulse Td to the line 23, when it enters the calodog light beam, ie with mirror surfaces 14, six starting pulses Td per one turn of the mirror. Another impulse sensor 24 connected to the axis 15 of the turn of the multifaceted swivel mirror 13, after each revolution of the mirror, sends to the line 25 a pulse of completion Tg. The non-parallelism of the mirrored surfaces 14 The instability of the axis of rotation 15 causes the recording position of the light beam 2 on the information carrier 19, which are perpendicular to the recording direction, further referred to as Y-positioning. Y-errors, which, due to the unevenness of the mirror surfaces 14, are influenced by the direction of the recording, result in irregular spacing between the lines. The difference in the corners between the contacting mirror surfaces 14 means that the place of the beginning and end of the lines varies from line to line and the asperities of the mirror surfaces 14 lead to deviations of the recording light beam 2 from those positions on the line of lines it must be by certain moments, i.e. unequal angular velocity 9. light beam. These deviations, hereinafter referred to as X-errors (positioning), result in distortion within the string. At the same time, for good recording quality, it is necessary that lines 21 begin on conditional line 26, passing perpendicular to the recording direction, and end on parallel line 27 and that the intervals between the lines are equal. These requirements cannot be fulfilled without correcting the stated positioning factors. The device for correcting the positioning errors of a multifaceted rotary mirror 13 consists of a measuring device 28, an X-block 29 measurements, a Y-block 30 measurements, an X-sensor 31 correction values and a y-sensor 32 correction values, as well as from the 6 X.-correction element and Y-correction element 7, located on the path of the beam between the light source 1 and the multi-faceted rotating mirror 13. Measuring device 28 in the form of a measuring bar within a working width of the flat substrate 18 has a certain number of measuring elements, is located s on the reference line 33 and intended for determining the deviation of the beam in the directions X and Y. In this example of execution, there are three measuring elements 28o (, 28b and 28c at measurement points / 1, B and C), with measuring element 28 located in the beginning of the line area, measuring element 28 at the end of the line, measuring element 28 approximately in the middle of the line. The measuring device 28 is an integral part of the flat substrate 18. In another case, the measuring device 28 may be placed for measurements on a flat substrate 18 or inserted on the path of the beam instead of the flat substrate 18. To determine the error th Posy tioning within the measuring phase before recording, during which the rotary polygonal mirror 13 is rotated, the flat substrate 18 is shifted in the direction Y so that the measuring elements 28o (, 28fc and 28c (Figure 1) located in the plane of deflection of the light DR-
    711
    Part 2. Y-errors, measured at separate measuring points D, B and C along the recording direction by measuring elements 28a, 28b and 28c, are transmitted along double lines 34 to Y-unit 30 measurements and are converted into three measured values Y, g and V for each mirror surface 14.
    To determine the L errors, measurements are made of the difference in travel time of the light beam 2 between the pulse sensor 22 and the measuring element 28a (ui), between the measuring elements 28a and 28b (difl) J3 also between the measuring elements 28b and 28c (4i, ). The pulses marked in the pulse sensor 22 and the measuring elements 28y, 28b and 28c, when they are crossed by the light beam 2, are transmitted to the X-unit 29 of measurements along line 23, and also arrive on line 35 and are used there to measure the time difference. The measured time differences ui, uti and aij are converted into a triple of measured values of Cd, Xd) (for each mirror surface 14.
    During the phase of correction adjacent to the measuring phase, the X-sensor 31 correction values and the Y-sensor 32 correction values produce an increasing in the direction of the required correction three of the correction values Xd, X and X (;, and also Chd, H and YC, which are sequentially and in accordance with being and given
    the moment in the path of the beam by the mirrored surfaces 14 along lines 8 and 9 is applied to the Xg element 6 of the correction-line and the Y-element 7 of the corrector.
    Correction elements 6 and 7 correct the positional (iro) error errors, and the correction process is monitored by measuring device 28. For this, each time TpoJJKH measures the X, Xg and V values and Y, Y V, .-,. kuyu; -d-1e I1khol. ;. . .m; th -:.; ";;; - Hi paths. Pum Uk; .. And: -: - 1 i; oBHj ./-. i -: ---- v 14, r; u - ( ) and ;; o; i; ; T a ii ;; / -; 3, i4Hi, i 1 y9.jl4 ;; inii i: -v.; I, .- i ;. ; i, iii ii /, i: r; : jIj;: fJn: HH, l,: .., ;; {,
    , ;;) ;:: i.j ./; ,, i :: i; (-i,; .- ;; -::., ...,., .l Jt; Ufifi. iJJ .UjftlfM 1-) DIAL h (1NG: ijlliJtM.iJMn ls.) tJi i: iHIJii Hd } Г1,1) И / к (, .К) 11И «:) jtl / l O | fti f.
    ) UtHii -ii MHO) ogrykno). ) 1Гёо1 оГНО1о
    eight
    the mirror 13 is controlled by the feed of the stitic pulse T to the line 23 and the feeding of the completion pulse Tg to the line 25.
    Periodic correction of positioning errors continues until the measured deviations are compensated. The resulting correction values are stored in the corresponding sensors 31 and 32 of the correction values and made during a special pause in the record for correcting positioning errors.
    The range of correction values can lie between and Y t, with the correction value corresponding to the maximum deviation of the light beam in the -Y direction, the correction value Y :: Yf, i in the + direction, and the correction value / 2 - zero declination.
    During the recording phase, the starting pulses are delayed in the delay block 38 by the time corresponding to the travel time of the light beam 2 between the pulse sensor 22 and the desired line start point on the information carrier 19.
    The clock generator 39 generates a read clock for digital storage device i. Each delayed start pulse Tc restarts the read cycle, so that the first row image information is always read and recorded exactly at the selected start time of the row.
    In the preferred embodiment, the X-sensor 31 correction values and the sensor 32 correction values each have one interpol block, in which from each of the three correction values 1, and Hd, Hz and Y or y, Y and Y. by interpolating for each hPJ) to, 4.111, no fupki is displayed on the surface) SC11. and X f (X 1 or com-
    ;.:. ,,, .-. Jr-MilOI: /), I.SK, TO; 31S KYAZH
    .:: -MU: Ijn.ijt ijcTOBMo beam. 2
    : P - -; -4e: .i (; KO1.REKSH AND.
    ; ,, ,,:;.,. -iiii-i, :: and (;; D each
    ; ;. -.- I;,.: - D ;;. :-P.-I-.T-il POSSIBLE ..; j.;, i; iii;.; i ;;:;) i-t and. open1; -ii / i t. .inMii) i-ii | .ynj) CH iiorjsemnocTH i-Hyi i)., i; .iH.Hi) i.) (- H / j (; iiii (: TbK: rrkal i (4) jj) .. .i (rTfu, gigayuchy high iivia iTJif I oMHii.Tii. The described correction device can also be used in an original reading device or other systems of deflecting a light beam. Figure 2 shows an example of a measuring device 28 operating in conjunction with a measuring beam. - block 30. Measuring device 28 has three identical measuring elements 28 e (, 28 ′ and 28 s), measuring element 28 (contains the first sensor 40, which serves for measuring Y-error and the second sensor 41, which serves to measure X-errors. Sensors can be made, for example, from differential photodiodes. Light-sensitive over. Sensor 40 is parallel to the reference line 33, and sensor 41 surfaces are perpendicular. Positional sensors based on a high-resistance photosensitive material should be applied.The sensors 40 in measuring y-block 30 correspond to identically executed processing blocks 42, 43 and 44. Photocurrents 1 and 1 of sensor 40, caused by padak, a light beam, through a double line 34 are fed to integrators 45 and 46. Voltages and / and U at the outputs of integrators 45 and 46 are fed to differential block 47, in which the measured value Y is generated. The integrators 45 and 46 are implemented on the basis of the operational amplifiers covered by feedback through the capacitors C. In parallel with capacitors C, electronic switches 48 and 49 are included, represented in the diagram as mechanical switches. The switches each time, by the starting pulse Tg, are closed on line 23 and discharge capacitors C, so that the measured value of One mirror surface 14 is erased, before the corresponding measured value of the next mirror surface 4 is fixed; / The summation of photocurrent 1 and 1 "has a resultant high measurement accuracy of 55, i.e. noise of small photocurrents. precise alignment of the measuring elements is not necessary. nineteen . 10 Photo1H:) The sensors of the sensor 41 are placed on the comparator 50, which, when the light beam passes through the sensor 41, produces a pulse Td. Pulse T. along with pulses Tg and Tj. issued on lines 35. The method of measuring Y-errors is presented in more detail in FIG. 3, which shows the sensor 40 with the photosensitive surfaces of a differential photodiode parallel to the reference line 33, and various light paths. The path 51 of the light beam 2 must pass in the direction of the recording or the direction Y at an angle of ° C to the reference line 33 through the center of the surfaces 52. The angle of ° C may occur due to inaccurate installation of a differential photodiode or inaccurate laying of the reference line 33 relative to the direction V. The amounts of light energy removed from surfaces are equal to (), while the measured value is 0, i.e. the path 51 of the light beam 2 corresponds to a predetermined path without positioning errors. For the path 53 of the light beam 2 passing through the center of the surfaces 52, is also the measured Y-O value. This shows that the alignment of the differential photodiode with respect to the Y direction is optional. Trajectories 54 and 55 have positioning accuracy iv. In this case, the amounts of light energy taken from the surfaces are unequal (), and the measured value of Y is proportional to the positioning error. Fig. 4 shows an example of a measurement X-unit 29 connected to a pulse sensor 22 and a measuring device 28. Three digital counters 56, 57 and 58 are provided for measuring the time difference in measuring X-block 2.9, the clock inputs of which are 59, 60 and 61 are connected via valve circuits 62, 63 and 64 to a clock generator 65, in order to generate a sequence of clock pulses for counting T ,. The sequence of clock pulses of the counting Tj is triggered and stopped by means of valve circuits 62, .63 and 64 using the starting pulses T generated by the pulse sensor 22, and using imggles T, Tg and Tf. Produced by the AaT4HKaNO 41n measuring elements 28ot, 28b 28c so the current, counter states are proportional to the time differences, ui and L1 between on and off pulses. Digital output analogue converters 69, 70, and 71 are connected to outputs 66, 67, and 68 of digital counters 56., 57, and 58, in which the counter states are reconstructed into measured time differences in proportion to the three measured values X, Xd, and X for each specular surface 14. Digital the counters 56, 57 and 58 are reset to their original state at the end of the mirror surface 14, by the pulse Tj. are delayed in delay link 72, which prepares digital counters to measure time differences for the next mirror surface. Figure 5 shows an example of a Y-sensor 32 correction values or an X-sensor 31 values, a correction performed identically to each other. correction sensor 32 consists of three comparators 73, 74 and 75, three identical blocks 76, 77 and 78 of memory dividing circuit 79, interpolation block 80 and counter 81 of mirror surfaces 14. BLOCKS 76, 77 and 78 of memory during phase the corrections result in the correction values for the mirror surfaces 14 and memorize the values obtained for the Y-error compensation for subsequent recording. The memory block 76 adds and stores correction values for measurement point L, for example, at the mirror surfaces of the correction value, memory block 77 — correction values for measurement point B and memory block 78 — correction values of Measurement C box C. Memory block 76 They consist of six counters 82 direct / reverse counting with digital-analog converters 83 connected to them. Before the clock inputs 84 of the counter 82 forward / counting, valve circuits AND 85 are connected to which, from LINE 35, pulses T are sent. the phenomenon of ovogo beam 2 in the measurement point A; 912 Gate Circuits And 85 are controlled by the six output signals of the counter 81 of the mirror surfaces 14 from line 86. The counter 81 of the mirror surfaces 14 accumulate the number of starting pulses Tg coming from line 23 with the beginning of each mirror surface 14, so that the output signals on the outputs 87 of the counter The 81 mirror surfaces 14 designate the Hbie mirrors of the surface 14, which are / s currently in the path of the light beam. After each turn of the thrash head 13, the counter 81 of the mirror surfaces 14 is reset to its initial position by the completion pulse Tc coming from the line 25. The measured values with the Vt sign converted to measuring Y by block 30 are converted in the comparator 73 into logical controls. signals in such a way that pos. the target measured value corresponds to the level H, and the negative measured value level L. The logical control signals from the lines 88 are fed to the control inputs 89 of the forward / reverse counting of the forward / reverse counting counter 82 and thus determine whether clock pulses T are charged to a forward / down count counter 82 or subtracted from it. The principle of operation of the memory block 76 is as follows. Each time the light beam 2 passes through measuring point A to line 35, a pulse T is applied. Those gate circuits AND 85 that correspond to the mirror surfaces 14 currently in the path are cyclically opened by the corresponding output signals of the counter 81. the mirror surfaces 14. Putting The positive or negative deviations of the beam, recorded during the passage of the light beam 2 through the measuring point A, affect whether the pulses Td passing through the open gate circuits AND 85 Td increase or decrease the content of the corresponding forward / down counter 82, which using a digital-to-analog converter 83 is converted into larger or smaller correction values Y. For example, during the correction phase, with a positive beam deflection with each pulse T. the contents of the counter increase by one bit, thereby the corresponding correction value is periodically increased, with which the positive deviation is eventually compensated to zero. The compensated counter content is a memorized correction value for the write phase. For sequential and cyclic presentation of six triples of correction values X 5 and YC for six specular ones. surfaces 14 to interpolation unit 80 synchronously with the next input to the path of the beam of the mirror surface 14, a dividing circuit 79 is provided, controlled by the output signals of the counter 81 of the mirror surfaces 14 coming from line 86. Hatch marks the connections for the first mirror surface 14, three values correction Ud. , Yg., And the UL enters interpolation block 80. Interpolation unit 80 consists of amplifier 90, first integrator 91, second integrator 92 and summing amplifier 93 connected to amplifier 90 and integrators 91 and 92. Interpolation unit 80 forms, from triples of correction values, correction functions with the opposite sign. The non-inverting input of amplifier 90 is supplied with a correction value Y., the inverted input is at a mass potential. The non-inverted input of the first integrator 91 is applied by the electronic switch 94 to the correction value Yg, and to the non-inverted input of the second integrator 92 by another electronic switch 95 to the correction value Y. The invertible inputs of both integrators 91 and 92 are at a potential / 2. For each mirror surface, a pulse Td closes the electronic switch 94, a pulse Tg closes the electronic switch 95, and the TC pulse opens the switches 94 and 95. The switches controlled by the starting pulses Tg (not shown) discharge the capacitors C of integrators 91 and 92 Consider the process of linear interpolation in the following example. The discrete correction values Y Yc and Yr of a certain mirror surface 14 can be formed at 114,914 times i, i, and i., Times i - | , vj p a and VKO, the light beam crosses the measuring points. A, B and C. At the moment -t, the electronic switch 94 closes with the impulse T and supplies the integrator 91 with the correction value U „, thus turning it on. If, the integrator 91 produces a negative output voltage, {which in the summing amplifier 93 is subtracted from the correction value Ul until the correction value X is reached at time -t, At time -i, the electronic switch 95 closes and applies to integrator 92, the correction value of y, including his work. If this time Y. 7 U, the integrator 92 produces a positive output voltage, which is added to the correction value Yz, until by the moment i the correction value Y is reached. Figure 6 presents a variant of the correction device that implements the proposed method. The error correction in the X direction of the information carrier 19 is not carried out by deflecting the light beam in the X direction, but by appropriately controlling the output of the recording information from the digital unit 4 unit. The same element of the 6 X correction between the modulator 3 of the light and the element -, volume 7 correction. Corrections of the X correction coming from the X-sensor 31 are now received via line 8. To the clock generator 39 and control the frequency of the sequence of read clock pulses Tc for the digital memory block 4. Frequency control is implemented in such a way that the time information output internals change depending on the detected X-errors of the light beam 2, and the Y errors are compensated by appropriate compression or line stretching. Instead of changing the frequency of the sequence of read cycles f to the inter-face by the digital memory block 4 and the light modulator 3, a delay link controlled by the X-correction value can be provided. In another embodiment of the correction device (Fig. 7), there is no automatic X-error compensation X11. A delay line 96 is located between the digital storage unit 4 and the light modulator 3 and is controlled by the correction values. In the simplified measuring unit 29, for all the mirror surfaces 14 of the polyhedral rotary mirror 13 by means of temporal measurements using pulses Td and TC between measuring points A and C, the corresponding lengths of lines 2 are determined and the corresponding differences in lengths of lines Z are determined on their basis. 4Z / 2 for each mirror surface of a multifaceted rotating mirror is inserted into the delay line as: correction values 9 During recording, the stored correction values under the control of starting impulses The lines are called on line 23 synchronously with the turn of the mirror, and the recording data read from the digital memory device 4 in each row (and hence the record itself) is shifted relative to the first row so that the corresponding error of the row length is distributed each time at the beginning and end of the line. The proposed method improves the accuracy of the correction of positional errors. Vani.
    .J
    th //.,
    权利要求:
    Claims (9)
    [1]
    1. METHOD FOR CORRECTION OF ERRORS OF POSITIONING OF THE LIGHT BEAM, which consists in the fact that the light beam is deflected pointwise and line by line with a mirror polyhedron in the scanning plane, which is moved relative to the mirror polyhedron and across the direction of deviation, after which the positioning error is determined and eliminated depending on the value correction, characterized in that, in order to improve the accuracy of correction of positioning errors, control points are set in the scanning plane in occurrence real scan line for each mirror surface of the polyhedron is measured deviation of the true position of the points of scanning lines in two coordinates, according to the obtained values are formed and stored signals cor- 1 rektsii produce beam position correction by additional These changes in beam position on the correction value, then produce verification tests, which reveal correction errors, and change the value of the previously obtained correction in accordance with the received deviations beam supply and repeat these operations until the total error compensation, after which the modified correction value for the individual mirror surfaces of a polyhedron stored and then read out and used dlyakorrektsii positioning errors.
    [2]
    2. According to claim 1, on the other hand, in that the coordinate-wise additional deviations of the light beam before point-by-line and line-by-line scanning are performed using a mirror polyhedron. ’
    [3]
    3. The method according to ; p. 1 and 2, characterized in that for each mirror surface of the polyhedron, the correction function that is read during operation 'is interpolated and stored from the obtained correction values and used for the current correction of positioning errors.
    [4]
    4. The method according to claims 1-3, characterized in that the deviations of the position of the light point relative to the control point in two photosensitive surfaces perpendicular to the scanning direction are determined by measuring two photocurrents that integrate, and a difference signal is formed from the integrated photocurrents as a value coordinates 3.
    , SU .1145939
    [5]
    5. The method according to claims 1 to 4, characterized in that the deviation of the position of the light point from the control points in the scanning direction is determined by measuring the time of movement of the light points between the control points, then a signal of the difference in the time of movement is generated as the value of the X coordinate.
    [6]
    6. The method of pop. 1, characterized in that, in order to use .. a light beam modulated by a video signal, the position of the image information is corrected by changing the time sequence of the values of the video signal to the corresponding correction values.
    [7]
    7. The method according to claim 6, characterized in that the temporary after-. The sequence of video signal values is changed using a time delay change controlled by the correction values.
    [8]
    8. The method according to claim 6, characterized in that the magnitude of the video signal is stored and read out by means of the clock cycle, the time sequence of the magnitude of the video signal being changed by means of a change in the frequency of the reading clock controlled by the correction values.
    [9]
    9. The method according to PP.6-8, characterized in that the reading of the values of the video signal is carried out at the beginning of the line by means of a synchronizing start pulse.
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    同族专利:
    公开号 | 公开日
    EP0054170B1|1985-05-29|
    AU7832481A|1982-06-17|
    DE3046584A1|1982-07-08|
    JPS57150817A|1982-09-17|
    EP0054170A3|1983-04-06|
    EP0054170A2|1982-06-23|
    AU541956B2|1985-01-31|
    US4404596A|1983-09-13|
    DE3046584C2|1984-03-15|
    JPH0355803B2|1991-08-26|
    CA1170875A|1984-07-17|
    AT13601T|1985-06-15|
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    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    DE3046584A|DE3046584C2|1980-12-11|1980-12-11|Optical-mechanical scanner|
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